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Resonant soft x-ray scattering from structured polymer nanoparticles
Author(s) -
Tohru Araki,
Harald Ade,
Jeffrey M. Stubbs,
Donald C. Sundberg,
G. E. Mitchell,
Jeffrey B. Kortright,
A. L. D. Kilcoyne
Publication year - 2006
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.2356306
Subject(s) - scattering , soft matter , polymer , materials science , characterization (materials science) , nanoparticle , neutron scattering , nanomaterials , small angle neutron scattering , nanotechnology , optics , composite material , chemistry , physics , colloid
The application of resonant soft x-ray scattering to chemically heterogeneous soft condensed matter materials is presented. Two structured styrene-acrylic polymer composite latex particles 230 nm in diameter were utilized to delineate the potential utility of this technique. Angular scans at photon energies corresponding to strong scattering contrast between specific chemical moieties made it possible to infer the effective radii that correspond to the two polymer phases in the nanoparticles. The results show that resonant soft x-ray scattering should be a powerful complementary tool to neutron and hard x-ray scattering for the characterization of structured soft condensed matter nanomaterials. © 2006 American Institute of Physics. DOI: 10.1063/1.2356306

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