Doping effect on dark currents in In0.5Ga0.5As∕GaAs quantum dot infrared photodetectors grown by metal-organic chemical vapor deposition
Author(s) -
Krystyna DrozdowiczTomsia,
Ewa M. Goldys,
Lan Fu,
C. Jagadish
Publication year - 2006
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.2354432
Subject(s) - chemical vapor deposition , quantum dot , photodetector , dark current , materials science , doping , silicon , dopant , optoelectronics , infrared , quantum tunnelling , deposition (geology) , analytical chemistry (journal) , chemistry , optics , physics , paleontology , sediment , biology , chromatography
Stacked self-assembled In0.5Ga0.5As/GaAs quantum dot infrared photodetectors grown by low-pressure metal-organic chemical vapor deposition, with and without silicon dopants in the quantum dot layers, are investigated. The increase of dark currents observed at higher doping levels is attributed to higher defect density leading to stronger sequential resonant tunneling and to lowering of the operating temperature of the device
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