Open AccessSearching for O-X-B mode-conversion window with monitoring of stray microwave radiation in LHD
Author(s) -
H. Igami,
S. Kubo,
H. P. Laqua,
K. Nagasaki,
S. Inagaki,
T. Notake,
Τ. Shimozuma,
Y. Yoshimura,
T. Mutoh,
LHD Experimental Group
Publication year - 2006
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.2336460
Subject(s) - microwave , radiation , optics , physics , stray light , antenna (radio) , cyclotron , cathode ray , electron , materials science , electrical engineering , nuclear physics , quantum mechanics , engineering
In the Large Helical Device, the stray microwave radiation is monitored by using so-called sniffer probes during electron cyclotron heating. In monitoring the stray radiation, we changed the microwave beam injection angle and search the O-X-B mode-conversion window to excite electron Bernstein waves (EBWs). When the microwave beam is injected toward the vicinity of the predicted O-X-B mode-conversion window, the electron temperature rises in the central part of overdense plasmas. In that case, the stray radiation level near the injection antenna becomes low. These results indicate that monitoring the stray radiation near the injection antenna is helpful in confirming the effectiveness of excitation of EBWs simply without precise analysis
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