Recombination processes in midinfrared InGaAsSb diode lasers emitting at 2.37μm | Zendy

K. O’Brien | Zendy; Stephen J. Sweeney | Zendy; A.R. Adams | Zendy; B. N. Murdin | Zendy; A. Salhi | Zendy; Y. Rouillard | Zendy; A. Joullié | Zendy

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Recombination processes in midinfrared InGaAsSb diode lasers emitting at 2.37μm

Author(s) -

K. O’Brien,

Stephen J. Sweeney,

A.R. Adams,

B. N. Murdin,

A. Salhi,

Y. Rouillard,

A. Joullié

Publication year - 2006

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.2243973

Subject(s) - auger effect , optoelectronics , materials science , laser , diode , semiconductor laser theory , spontaneous emission , recombination , auger , atomic physics , wide bandgap semiconductor , chemistry , physics , optics , biochemistry , gene

The temperature dependence of the threshold current of InGaAsSb/AlGaAsSb compressively strained lasers is investigated by analyzing the spontaneous emission from working laser devices through a window formed in the substrate metallization and by applying high pressures. It is found that nonradiative recombination accounts for 80% of the threshold current at room temperature and is responsible for the high temperature sensitivity. The authors suggest that Auger recombination involving hot holes is suppressed in these devices because the spin-orbit splitting energy is larger than the band gap, but other Auger processes persist and are responsible for the low T-0 values.

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