Optical properties of inorganic AgSb recording thin film | Zendy

Y.H. Fang | Zendy; P. C. Kuo | Zendy; P. W. Chen | Zendy; Wei-Chih Hsu | Zendy; C.Y. Chou | Zendy; Ting Wu | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Optical properties of inorganic AgSb recording thin film

Author(s) -

Y.H. Fang,

P. C. Kuo,

P. W. Chen,

Wei-Chih Hsu,

C.Y. Chou,

Ting Wu

Publication year - 2006

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.2218774

Subject(s) - thin film , materials science , sputter deposition , wavelength , sputtering , layer (electronics) , numerical aperture , optical recording , optics , contrast ratio , optical disc , phase (matter) , optoelectronics , thermal , nanotechnology , chemistry , physics , organic chemistry , meteorology

50nm Ag1−xSbx (x=10.8–25.5) thin films were prepared by magnetron sputtering. Thermal analysis shows that the phase change occurs around 250°C. The optical property analysis show that the as-deposited Ag80.9Sb19.1 films have high reflectivity of about 62%–73%. After heat treatment at 300°C, the contrast of Ag80.9Sb19.1 film is 12.5%–17% for wavelengths between 400 and 800nm. Dynamic test shows that using the Ag80.9Sb19.1 film as the memory layer of write once optical disk, a carrier-to-noise ratio of about 45dB can be achieved at λ=657nm, numerical aperture of 0.65, and a linear velocity of 3.5m∕s.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research