Parametric resonance based scanning probe microscopy | Zendy

Miriam MorenoMoreno | Zendy; Arvind Raman | Zendy; Julio GómezHerrero | Zendy; R. Reifenberger | Zendy

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Parametric resonance based scanning probe microscopy

Author(s) -

Miriam MorenoMoreno,

Arvind Raman,

Julio GómezHerrero,

R. Reifenberger

Publication year - 2006

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.2202132

Subject(s) - parametric oscillator , resonance (particle physics) , microscopy , scanning probe microscopy , spectroscopy , materials science , non contact atomic force microscopy , parametric statistics , bandwidth (computing) , optics , excited state , mechanical resonance , optoelectronics , vibration , physics , atomic physics , acoustics , kelvin probe force microscope , statistics , mathematics , computer network , quantum mechanics , computer science

We propose a mode of dynamic scanning probe microscopy based on parametric resonance for highly sensitive nanoscale imaging and force spectroscopy. In this mode the microcantilever probe is excited by means of a closed-loop electronic circuit that modulates the microcantilever stiffness at a frequency close to twice its natural resonance frequency. Under ambient conditions this parametric pumping leads to self-sustained oscillations in a narrow frequency bandwidth thereby resulting in exquisitely sharp, controllable, and non-Lorentzian resonance peaks. We discuss and demonstrate the potential of imaging and force spectroscopy using this mode.

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