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Infrared spectroscopic ellipsometry in the spectral range from ω=360cm−1toω=1500cm−1 and Raman scattering spectroscopy are applied to study the long-wavelength optical phonon modes and dielectric constants of MgxZn1−xO thin films in the composition range 0⩽x⩽1. The samples were grown by pulsed laser deposition on sapphire substrates. X-ray diffraction measurements of the thin film samples reveal the hexagonal wurtzite crystal structure for x⩽0.53 and the cubic rocksalt crystal structure for x⩾0.67. A systematic variation of the phonon mode frequencies with Mg-mole fraction x is found for both hexagonal and cubic MgxZn1−xO thin films. The modified random isodisplacement model matches the observed composition dependence of the phonon mode frequencies for the hexagonal structure thin films [J. Chen and W. Z. Shen, Appl. Phys. Lett. 83, 2154 (2003)], whereas a simple linear approximation scheme is sufficient for the cubic structure part. We observe a discontinuous behavior of the transverse optical phonon mod...

Infrared optical properties of MgxZn1−xO thin films (0⩽x⩽1): Long-wavelength optical phonons and dielectric constants