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Monolithically integrated optical modulator based on polycrystalline Ba0.7Sr0.3TiO3 thin films
Author(s) -
Zhimou Xu,
Masato Suzuki,
Yuichiro Tanushi,
Shin Yokoyama
Publication year - 2006
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.2197288
Subject(s) - materials science , thin film , crystallite , optoelectronics , amorphous solid , substrate (aquarium) , layer (electronics) , optics , photolithography , spin coating , etching (microfabrication) , nanotechnology , chemistry , oceanography , physics , organic chemistry , geology , metallurgy
Good-quality polycrystalline Ba0.7Sr0.3TiO3 (BST0.7) thin films were deposited on fused silica substrates and Si substrates having a thick amorphous SiO2 layer at a relatively low temperature of 550°C by spin-coating metal organic solutions. The thin films were highly transparent to light in the ultraviolet to near-infrared wavelength regions. The optical propagation loss for a 5-μm-wide and 300-nm-thick polycrystalline waveguide based on BST0.7 was about 17dB∕cm at a wavelength of 632.8nm. An electro-optic Mach-Zehnder interferometer modulator based on the polycrystalline BST0.7 thin film was monolithically integrated on a Si substrate with standard lithography and wet etching. Optical modulation was successfully demonstrated. The estimated electro-optic coefficient (6.7pm∕V) is the highest reported so far for this kind of film deposited on a fused silica substrate or a Si substrate with an amorphous SiO2 layer.

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