Two distinct dielectric relaxation mechanisms in the low-frequency range in Bi5TiNbWO15 ceramics
Author(s) -
Zhiguo Yi,
Y. X. Li,
Yue Wang,
Qisheng Yin
Publication year - 2006
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.2191953
Subject(s) - dielectric , relaxation (psychology) , condensed matter physics , materials science , grain boundary , ceramic , ferroelectric ceramics , dielectric loss , cole–cole equation , conductivity , dielectric spectroscopy , vacancy defect , atmospheric temperature range , diffusion , curie temperature , ferroelectricity , thermodynamics , chemistry , optoelectronics , microstructure , ferromagnetism , physics , composite material , psychology , social psychology , electrode , electrochemistry
This work was supported by the Ministry of Science and Technology of China through 973-Project No. 2002CB613307 and the National Natural Science Foundation of China No. 50572113.
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