Open AccessIn situ electrical probing and bias-mediated manipulation of dielectric nanotubes in a high-resolution transmission electron microscope
Author(s) -
Dmitri Golberg,
Masanori Mitome,
Keiji Kurashima,
Chunyi Zhi,
Chengchun Tang,
Yoshio Bando,
O. Lourie
Publication year - 2006
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.2186987
Subject(s) - materials science , carbon nanotube , transmission electron microscopy , boron nitride , biasing , nanotube , electrode , dielectric , electron , nanotechnology , optoelectronics , analytical chemistry (journal) , voltage , chemistry , electrical engineering , physics , chromatography , engineering , quantum mechanics
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