Photoconductivity and highly selective ultraviolet sensing features of amorphous silicon carbon nitride thin films
Author(s) -
ChunWei Chen,
Cheng-Chia Huang,
Yun-Yue Lin,
WeiFang Su,
LiChyong Chen,
KueiHsien Chen
Publication year - 2006
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.2178406
Subject(s) - photoconductivity , materials science , optoelectronics , thin film , photodetector , silicon , ultraviolet , amorphous silicon , amorphous solid , silicon nitride , graphitic carbon nitride , quantum efficiency , carbon fibers , nitride , amorphous carbon , crystalline silicon , nanotechnology , chemistry , photocatalysis , composite material , layer (electronics) , biochemistry , organic chemistry , composite number , catalysis
Photoconductivity of amorphous silicon carbon nitride (a-SiCN) as a function of incident photon energies has been studied. A metal-semiconductor-metal photodetector device based on the a-SiCN thin film demonstrates excellent selective ultraviolet sensing features. A large photo-to-dark current ratio about 5000 and a relative quantum efficiency about ∼105 under illumination of the 250nm light source and a bias voltage of 5V were observed. A model based on the heterogeneous structure in the a-SiCN thin film which consists of π−π* bands and σ−σ* bands was introduced to account for the observed photoconductive transport properties.
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