Optimization of negative ion sources for a heavy-ion-beam probe | Zendy

M. Nishiura | Zendy; T. Ido | Zendy; A. Shimizu | Zendy; Susumu Katō | Zendy; K. Tsukada | Zendy; A. Nishizawa | Zendy; Y. Hamada | Zendy; Yoshiyasu Matsumoto | Zendy; Alexander Mendenilla | Zendy; M. Wada | Zendy

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Optimization of negative ion sources for a heavy-ion-beam probe

Author(s) -

M. Nishiura,

T. Ido,

A. Shimizu,

Susumu Katō,

K. Tsukada,

A. Nishizawa,

Y. Hamada,

Yoshiyasu Matsumoto,

Alexander Mendenilla,

M. Wada

Publication year - 2006

Publication title -

review of scientific instruments

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.605

H-Index - 165

eISSN - 1089-7623

pISSN - 0034-6748

DOI - 10.1063/1.2170094

Subject(s) - plasma , ion , atomic physics , ion beam , sputtering , beam (structure) , ion beam deposition , ion source , materials science , ion gun , large helical device , plasma diagnostics , physics , optics , nuclear physics , thin film , nanotechnology , quantum mechanics

The development of plasma-sputter-type negative ion sources is underway for the heavy-ion-beam probe system as plasma diagnostic beams of the large helical device (LHD) for potential and fluctuation field measurements. Our purpose is to increase the doubly charged exchanged Au^+ beam intensity to enhance the detection signal after passing through the plasmas of the LHD. For this purpose, the characterization of the Au^? ion source and the beam optics has been carried out both experimentally and numerically. Based on these results, a new plasma-sputter-type negative ion source is designed and tested

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