Open AccessDepth-Resolved Composition and Chemistry of Ultra-Thin Films by Angle-Resolved X-Ray Photoelectron Spectroscopy
Author(s) -
C. R. Brundle,
G. Conti,
H. Graoui,
M.A. Foad,
S. Hung,
Chunlei Wang,
Y. Uritsky,
P. Mack,
Jackie Wolstenholme
Publication year - 2005
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.2062980
Subject(s) - overlayer , x ray photoelectron spectroscopy , materials science , annealing (glass) , oxide , silicon , analytical chemistry (journal) , optoelectronics , composite material , physics , chemistry , condensed matter physics , nuclear magnetic resonance , chromatography , metallurgy
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