Open AccessDetermination of thickness and lattice distortion for the individual layer of strained Al0.14Ga0.86N∕GaN superlattice by high-angle annular dark-field scanning transmission electron microscopy
Author(s) -
Makoto Shiojiri,
Miran Čeh,
Sašo Šturm,
ChangCheng Chuo,
J. T. Hsu,
JerRen Yang,
H. Saijo
Publication year - 2005
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.1995952
Subject(s) - dark field microscopy , superlattice , scanning transmission electron microscopy , materials science , transmission electron microscopy , dislocation , optoelectronics , scanning electron microscope , optics , microscopy , physics , nanotechnology , composite material
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom