Open AccessThermal characterization and analysis of phase change random access memory
Author(s) -
Vincent Giraud,
J. Cluzel,
V. Sousa,
A. Jacquot,
A. Dauscher,
B. Lenoir,
H. Scherrer,
Sara Romer
Publication year - 2005
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.1944910
Subject(s) - thermal conductivity , materials science , thermal conductivity measurement , tin , amorphous solid , titanium nitride , phase change memory , thermal , phase change material , characterization (materials science) , composite material , phase (matter) , fabrication , nitride , thermodynamics , metallurgy , nanotechnology , chemistry , layer (electronics) , physics , medicine , alternative medicine , organic chemistry , pathology
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