z-logo
open-access-imgOpen Access
Bright green electroluminescence from Tb3+ in silicon metal-oxide-semiconductor devices
Author(s) -
J. Sun,
W. Skorupa,
T. Dekorsy,
M. Helm,
L. Rebohle,
T. Gebel
Publication year - 2005
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.1935766
Subject(s) - electroluminescence , materials science , optoelectronics , photoluminescence , oxide , luminescence , quantum efficiency , annealing (glass) , indium tin oxide , light emitting diode , silicon , semiconductor , terbium , nanotechnology , thin film , metallurgy , layer (electronics)
Bright green electroluminescence with luminance up to 2800cd∕m2 is reported from indium-tin-oxide∕SiO2:Tb∕Si metal-oxide-semiconductor devices. The SiO2:Tb3+ gate oxide was prepared by thermal oxidation followed by Tb+ implantation. Electroluminescence and photoluminescence properties were studied with variations of the Tb3+ ion concentration and the annealing temperature. The optimized device shows a high external quantum efficiency of 16% and a luminous efficiency of 2.1lm∕W. The excitation processes of the strong green electroluminescence are attributed to the impact excitation of the Tb3+ luminescent centers by hot electrons and the subsequent crossrelaxation from D35 to D45 energy levels. Light-emitting devices with micrometer size fabricated by the standard metal-oxide-semiconductor technology are demonstrated.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom