Open AccessA different way of performing picosecond ultrasonic measurements in thin transparent films based on laser-wavelength effects
Author(s) -
A. Devos,
Renaud Côté,
G. Caruyer,
A. Lefèvre
Publication year - 2005
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.1929869
Subject(s) - materials science , picosecond , refractive index , wavelength , dielectric , ultrasonic sensor , silicon , optics , laser , thin film , optoelectronics , acoustics , nanotechnology , physics
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