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Texture formation in FePt thin films via thermal stress management
Author(s) -
Paul G. Rasmussen,
X. Rui,
J. E. Shield
Publication year - 2005
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.1924889
Subject(s) - thermal expansion , materials science , residual stress , thin film , texture (cosmology) , diffraction , composite material , stress (linguistics) , orientation (vector space) , condensed matter physics , optics , nanotechnology , geometry , linguistics , philosophy , image (mathematics) , physics , mathematics , artificial intelligence , computer science
The transformation variant of the fcc to fct transformation in FePt thin films was tailored by controlling the stresses in the thin films, thereby allowing selection of in- or out-of-plane c-axis orientation. FePt thin films were deposited at ambient temperature on several substrates with differing coefficients of thermal expansion relative to the FePt, which generated thermal stresses during the ordering heat treatment. X-ray diffraction analysis revealed preferential out-of-plane c-axis orientation for FePt films deposited on substrates with a similar coefficients of thermal expansion, and random orientation for FePt films deposited on substrates with a very low coefficient of thermal expansion, which is consistent with theoretical analysis when considering residual stresses.

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