Nucleation and growth of platelets in hydrogen-ion-implanted silicon | Zendy

M. Nastasi | Zendy; T. Höchbauer | Zendy; Jung-Kun Lee | Zendy; Amit Misra | Zendy; J. P. Hirth | Zendy; M. C. Ridgway | Zendy; Tamzin Lafford | Zendy

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Nucleation and growth of platelets in hydrogen-ion-implanted silicon

Author(s) -

M. Nastasi,

T. Höchbauer,

Jung-Kun Lee,

Amit Misra,

J. P. Hirth,

M. C. Ridgway,

Tamzin Lafford

Publication year - 2005

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.1900309

Subject(s) - nucleation , platelet , silicon , precipitation , hydrogen , materials science , ion , cleavage (geology) , ion implantation , crystallography , chemistry , metallurgy , composite material , physics , organic chemistry , fracture (geology) , meteorology , immunology , biology

H ion implantation into crystalline Si is known to result in the precipitation of planar defects in the form of platelets. Hydrogen-platelet formation is critical to the process that allows controlled cleavage of Si along the plane of the platelets and subsequent transfer and integration of thinly sliced Si with other substrates. Here we show that H-platelet formation is controlled by the depth of the radiation-induced damage and then develop a model that considers the influence of stress to correctly predict platelet orientation and the depth at which platelet nucleation density is a maximum.

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