High-efficiency diffractive x-ray optics from sectioned multilayers | Zendy

Hyon Chol Kang | Zendy; G. B. Stephenson | Zendy; C. Liu | Zendy; R. Conley | Zendy; Albert T. Macrander | Zendy; J. Mäser | Zendy; S. Bajt | Zendy; Henry N. Chapman | Zendy

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High-efficiency diffractive x-ray optics from sectioned multilayers

Author(s) -

Hyon Chol Kang,

G. B. Stephenson,

C. Liu,

R. Conley,

Albert T. Macrander,

J. Mäser,

S. Bajt,

Henry N. Chapman

Publication year - 2005

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.1897061

Subject(s) - diffraction , optics , materials science , x ray crystallography , diffraction efficiency , x ray optics , x ray , intensity (physics) , physics

We investigate the diffraction properties of sectioned multilayers in Laue (transmission) geometry, at hard x-ray energies (9.5 and 19.5keV). Two samples are studied, a W∕Si multilayer of 200×(29nm) periods, and a Mo∕Si multilayer of 2020×(7nm) periods, with cross-section depths ranging from 2to17μm. Reflectivities as high as 70% are observed. This exceeds the theoretical limit for standard zone plates operating in the multibeam regime, demonstrating that all of the intensity can be directed into a single diffraction order in small-period structures.

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