Charge-carrier properties in synthetic single-crystal diamond measured with the transient-current technique | Zendy

H. Pernegger | Zendy; S. Roe | Zendy; P. Weilhammer | Zendy; V. Eremin | Zendy; H. Frais-Kölbl | Zendy; E. Griesmayer | Zendy; H. Kagan | Zendy; S. Schnetzer | Zendy; R. Stone | Zendy; W. Trischuk | Zendy; Daniel J. Twitchen | Zendy; Andrew J. Whitehead | Zendy

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Charge-carrier properties in synthetic single-crystal diamond measured with the transient-current technique

Author(s) -

H. Pernegger,

S. Roe,

P. Weilhammer,

V. Eremin,

H. Frais-Kölbl,

E. Griesmayer,

H. Kagan,

S. Schnetzer,

R. Stone,

W. Trischuk,

Daniel J. Twitchen,

Andrew J. Whitehead

Publication year - 2005

Publication title -

journal of applied physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.699

H-Index - 319

eISSN - 1089-7550

pISSN - 0021-8979

DOI - 10.1063/1.1863417

Subject(s) - charge carrier , chemical vapor deposition , diamond , materials science , single crystal , space charge , electric field , carrier lifetime , detector , electron mobility , charge (physics) , optoelectronics , transient (computer programming) , particle detector , electrode , current (fluid) , analytical chemistry (journal) , electron , chemistry , optics , silicon , physics , operating system , quantum mechanics , computer science , composite material , thermodynamics , crystallography , chromatography

For optimal operation of chemical-vapor deposition (CVD) diamonds as charged particle detectors it is important to have a detailed understanding of the charge-carrier transport mechanism. This includes the determination of electron and hole drift velocities as a function of electric field, charge carrier lifetimes, as well as effective concentration of space charge in the detector bulk. We use the transient-current technique, which allows a direct determination of these parameters in a single measurement, to investigate the charge-carrier properties in a sample of single-crystal CVD diamond. The method is based on the injection of charge using an alpha source close to the surface and measuring the induced current in the detector electrodes as a function of time

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