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Element-specific magnetic properties of Co2MnSi thin films
Author(s) -
Shane Stadler,
D. H. Minott,
D. Harley,
J. Craig,
Mahmud Khan,
Igor Dubenko,
Naushad Ali,
K. T. Story,
J. Dvořák,
Y. U. Idzerda,
Darío Arena,
Vincent G. Harris
Publication year - 2005
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.1847391
Subject(s) - magnetic circular dichroism , thin film , materials science , pulsed laser deposition , silicon , silicon nitride , x ray magnetic circular dichroism , analytical chemistry (journal) , nitride , magnetic anisotropy , layer (electronics) , spectral line , condensed matter physics , optics , optoelectronics , magnetization , composite material , chemistry , magnetic field , nanotechnology , physics , chromatography , astronomy , quantum mechanics
Co2MnSi thin films were grown on Al2O3 (a plane) and GaAs (001) substrates and on thin silicon nitride windows using pulsed laser deposition. Angle-dependent magneto-optic Kerr effect measurements reveal both a uniaxial and a fourfold magnetocrystalline anisotropy for films grown on GaAs (001). X-ray magnetic circular dichroism spectra were measured at the L2,3 edges of the thin films as a function of aluminum cap layer thickness, and transmission mode L2,3 x-ray absorption through a 1000-A Co2MnSi film grown on a silicon nitride membrane were measured, indicating that deviations from metalliclike spectra are likely due oxidation or contamination. Element-specific moments for Co and Mn were calculated from the X-ray magnetic circular dichroism data of a nonoxidized film.

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