Electrical characterization of p-GaAs epilayers disordered by doped spin-on-glass
Author(s) -
Prakash N. K. Deenapanray,
M. Petravić,
C. Jagadish,
M. Krispin,
F.D. Auret
Publication year - 2005
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.1846140
Subject(s) - doping , annealing (glass) , materials science , analytical chemistry (journal) , impurity , epitaxy , secondary ion mass spectrometry , atmospheric temperature range , arrhenius equation , deep level transient spectroscopy , ion , activation energy , chemistry , optoelectronics , silicon , nanotechnology , physics , organic chemistry , chromatography , layer (electronics) , meteorology , composite material
One of the authors P. N. K. D.d acknowledges the financial support of the Australian Research Council. A second sF. D. A.d is grateful to the National Research Foundation, South Africa, for its financial support.
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