A differential mechanical profilometer for thickness measurement | Zendy

J. Maia Alves | Zendy; M.C. Brito | Zendy; J.M. Serra | Zendy; A.M. Vallêra | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

A differential mechanical profilometer for thickness measurement

Author(s) -

J. Maia Alves,

M.C. Brito,

J.M. Serra,

A.M. Vallêra

Publication year - 2004

Publication title -

review of scientific instruments

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.605

H-Index - 165

eISSN - 1089-7623

pISSN - 0034-6748

DOI - 10.1063/1.1821627

Subject(s) - profilometer , transducer , materials science , optics , displacement (psychology) , differential (mechanical device) , differential pressure , measure (data warehouse) , sensitivity (control systems) , sample (material) , acoustics , composite material , surface finish , computer science , physics , electronic engineering , mechanics , psychology , psychotherapist , thermodynamics , database , engineering

A low cost differential profilometer based on standard commercial displacement transducers is fully described. Unlike most common profilometers this device can be used to measure the thickness profile of samples having both surfaces irregular. A sensitivity of about 0.2 μm, independent of the sample thickness is achieved.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research