Open AccessVertical composition gradient in InGaAs∕GaAs alloy quantum dots as revealed by high-resolution x-ray diffraction
Author(s) -
M. Hanke,
D. Grigoriev,
M. Schmidbauer,
P. Schäfer,
Ralf Köhler,
R.L. Sellin,
Udo W. Pohl,
D. Bimberg
Publication year - 2004
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.1803938
Subject(s) - quantum dot , wetting layer , scattering , materials science , diffraction , stack (abstract data type) , alloy , gallium arsenide , superlattice , layer (electronics) , wetting , resolution (logic) , condensed matter physics , optoelectronics , optics , nanotechnology , composite material , physics , artificial intelligence , computer science , programming language
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