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Quantitative force measurements in liquid using frequency modulation atomic force microscopy
Author(s) -
Takayuki Uchihashi,
Michael J. Higgins,
Satoshi Yasuda,
Suzanne Jarvis,
Seiji Akita,
Yoshikazu Nakayama,
John E. Sader
Publication year - 2004
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.1803932
Subject(s) - atomic force microscopy , non contact atomic force microscopy , frequency modulation , kelvin probe force microscope , surface forces apparatus , magnetic force microscope , force spectroscopy , nanotechnology , chemistry , materials science , analytical chemistry (journal) , physics , magnetic field , computer science , computer network , bandwidth (computing) , chromatography , magnetization , quantum mechanics
The measurement of short-range forces with the atomic force microscope (AFM) typically requires implementation of dynamic techniques to maintain sensitivity and stability. While frequency modulation atomic force microscopy (FM-AFM) is used widely for high-resolution imaging and quantitative force measurements in vacuum, quantitative force measurements using FM-AFM in liquids have proven elusive. Here we demonstrate that the formalism derived for operation in vacuum can also be used in liquids, provided certain modifications are implemented. To facilitate comparison with previous measurements taken using surface forces apparatus, we choose a model system (octamethylcyclotetrasiloxane) that is known to exhibit short-ranged structural ordering when confined between two surfaces. Force measurements obtained are found to be in excellent agreement with previously reported results. This study therefore establishes FM-AFM as a powerful tool for the quantitative measurement of forces in liquid.

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