Bond length contraction in Au nanocrystals formed by ion implantation into thin SiO2 | Zendy

P. Kluth | Zendy; Bernt Johannessen | Zendy; Vincent Giraud | Zendy; A. Cheung | Zendy; C. J. Glover | Zendy; G. de M. Azevedo | Zendy; G. J. Foran | Zendy; M. C. Ridgway | Zendy

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Bond length contraction in Au nanocrystals formed by ion implantation into thin SiO2

Author(s) -

P. Kluth,

Bernt Johannessen,

Vincent Giraud,

A. Cheung,

C. J. Glover,

G. de M. Azevedo,

G. J. Foran,

M. C. Ridgway

Publication year - 2004

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.1803619

Subject(s) - extended x ray absorption fine structure , bond length , nanocrystal , annealing (glass) , materials science , ion implantation , transmission electron microscopy , crystallography , x ray absorption spectroscopy , ion , absorption spectroscopy , octahedron , analytical chemistry (journal) , chemistry , crystal structure , nanotechnology , optics , composite material , physics , organic chemistry , chromatography

P. K. is grateful to the Humboldt Foundation in Germany for support. P.K., B.J., A.C., C.J.G., G.d.M.A., G.J.F., and M.C.R. were supported by the Australian Synchrotron Research Program.

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