High-resolution Raman microscopy of curled carbon nanotubes | Zendy

Hyunhyub Ko | Zendy; Yuri Pikus | Zendy; Chaoyang Jiang | Zendy; Andrea Jauß | Zendy; O. Hollricher | Zendy; Vladimir V. Tsukruk | Zendy

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High-resolution Raman microscopy of curled carbon nanotubes

Author(s) -

Hyunhyub Ko,

Yuri Pikus,

Chaoyang Jiang,

Andrea Jauß,

O. Hollricher,

Vladimir V. Tsukruk

Publication year - 2004

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.1795981

Subject(s) - raman spectroscopy , carbon nanotube , bent molecular geometry , nanotube , materials science , microscopy , bending , nanotechnology , mechanical properties of carbon nanotubes , optical properties of carbon nanotubes , composite material , optics , physics

The use of confocal Raman imaging spectroscopy and atomic force microscopy for identifying conditions of carbon nanotubes with bent nanotube bundles in the bent state was described. It was found that the tangential G mode on Raman spectra systemically shifts downward upon nanotube bending. The frequency shifts observed in the nanotubes were due to tensile strain of the bending nanotube arrays, which resulted in the loosening of C-C bonds in the outer walls. It was speculated that the frequency shift in Raman spectra was used for fast monitoring of the bending state of the standing carbon nanotube in gas and fluid flow nanosensors.open282

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