Measurement of impurity emission profiles in CHS Plasma using AXUV photodiode arrays and VUV bandpass filters | Zendy

C. Suzuki | Zendy; B. J. Peterson | Zendy; K. Ida | Zendy

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Measurement of impurity emission profiles in CHS Plasma using AXUV photodiode arrays and VUV bandpass filters

Author(s) -

C. Suzuki,

B. J. Peterson,

K. Ida

Publication year - 2004

Publication title -

review of scientific instruments

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.605

H-Index - 165

eISSN - 1089-7623

pISSN - 0034-6748

DOI - 10.1063/1.1787132

Subject(s) - preamplifier , photodiode , materials science , optoelectronics , impurity , optics , band pass filter , foil method , converters , ultraviolet , plasma , plasma diagnostics , extreme ultraviolet , voltage , physics , cmos , amplifier , laser , quantum mechanics , composite material

We have designed a compact and low-cost diagnostic system for spatiotemporal distributions of specific vacuum ultraviolet (VUV) emission lines from impurities in Compact Helical System (CHS) plasmas. The system consists of 20 channel absolute extreme ultraviolet photodiode arrays combined with interchangeable thin foil filters which have passbands in the VUV region. A compact mounting module which contains all the components including an in-vacuum preamplifier for immediate current?voltage conversion has been designed and successfully fabricated. A preliminary measurement with a single module using an aluminum foil filter has been carried out for monitoring the behavior of oxygen impurity in CHS, and initial results have been obtained. Two identical modules equipped with Versa Module European bus-based analog-digital converters will be available for future tomographic measurements

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