Open AccessMeasurement of ion temperature and density profiles with a time-of-flight type neutral-particle analyzer
Author(s) -
M. Ichimura,
H. Higaki,
T. Kawabata,
D. Inoue,
H. Nagai,
S. Kakimoto,
Yusuke Yamaguchi,
K. Horinouchi,
K. Ide,
K. Nakagome,
T. Cho
Publication year - 2004
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.1785265
Subject(s) - ion , time of flight , neutral particle , atomic physics , plasma , spectrum analyzer , resonance (particle physics) , plasma diagnostics , particle (ecology) , materials science , ion cyclotron resonance , temperature measurement , physics , optics , cyclotron , nuclear physics , oceanography , quantum mechanics , geology
High beta plasmas in the anchor cell of the GAMMA 10 tandem mirror are formed by using a fundamental ion cyclotron resonance heating. Because the closed resonance surface exists near the midplane of the anchor cell, strongly peaked profile of the plasma pressure will be formed. To measure the axial profiles of the ion temperature and density, a time-of-flight type neutral-particle analyzer (TOF–NPA) has been developed. TOF–NPA can detect neutral particles and photons separately at the same time. The ion temperature and density have been evaluated from the particle and photon signals, respectively. The peaked profile of the ion temperature within the closed resonance surface has been confirmed
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