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Resonant Raman scattering of a single layer of Si nanocrystals on a silicon substrate
Author(s) -
A. Wellner,
Vincent Paillard,
H. Coffin,
N. Cherkashin,
C. Bonafos
Publication year - 2004
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.1765853
Subject(s) - silicon , materials science , raman spectroscopy , photoluminescence , raman scattering , substrate (aquarium) , transmission electron microscopy , nanocrystal , optoelectronics , layer (electronics) , ion implantation , nanoparticle , quantum tunnelling , nanotechnology , ion , optics , chemistry , oceanography , physics , organic chemistry , geology

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