Open AccessErratum: Measurement of Diffused Semiconductor Surface Concentrations by Infrared Plasma Reflection
Author(s) -
E. E. Gardner,
W. Kappallo,
E. R. Gordon
Publication year - 1967
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.1754938
Subject(s) - semiconductor , plasma , infrared , reflection (computer programming) , materials science , light reflection , optoelectronics , analytical chemistry (journal) , optics , chemistry , environmental chemistry , physics , computer science , nuclear physics , programming language
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