High Temperature X-Ray Diffraction Techniques for Active Metals
Author(s) -
J. J. Hanak,
A.H. Daane
Publication year - 1961
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.1717476
Subject(s) - diffraction , tungsten , materials science , x ray crystallography , rare earth , melting temperature , analytical chemistry (journal) , metallurgy , optics , composite material , chemistry , physics , chromatography
Techniques are described for obtaining x ray diffraction information on active metals at high temperatures. One method is used to 1000 deg C with rare earths; the other method is used to 2200 deg C with tungsten, and to 1400 deg C with some f the higher melting rare earths. The latter approach permits simultaneous measurement of resistance of the specimens vs temperature and the diffraction pattern, which facilitates the characterizing of the high temperature forms of the metals. (auth
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