Open AccessErratum: Phase-Shift-Corrected Thickness Determination of Silicon Dioxide on Silicon by Ultraviolet Interference
Author(s) -
R. A. Wesson,
R. P. Phillips,
W. A. Pliskin
Publication year - 1967
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.1710228
Subject(s) - silicon , silicon dioxide , interference (communication) , materials science , ultraviolet , phase (matter) , optoelectronics , optics , chemistry , physics , composite material , telecommunications , computer science , channel (broadcasting) , organic chemistry
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