Open AccessErratum: Optical Thickness Measurement of Thin Transparent Layers on Silicon
Author(s) -
F. Reizman
Publication year - 1966
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.1708854
Subject(s) - materials science , silicon , optoelectronics , thin film , optics , nanotechnology , physics
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