Open AccessAnnealing of Infrared Defect Absorption Bands in 40-MeV Electron-Irradiated Silicon
Author(s) -
J. C. Corelli,
G. Oehler,
Joseph F. Becker,
Kent J. Eisentraut
Publication year - 1965
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.1703129
Subject(s) - silicon , annealing (glass) , infrared , materials science , irradiation , electron , absorption (acoustics) , atomic physics , optoelectronics , optics , physics , nuclear physics , metallurgy , composite material
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