Open AccessErratum: Capacitance energy level spectroscopy of deep-lying semiconductor impurities using Schottky barriers
Author(s) -
G. I. Roberts,
C.R. Crowell
Publication year - 1973
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.1661936
Subject(s) - capacitance , impurity , semiconductor , schottky barrier , schottky diode , materials science , spectroscopy , optoelectronics , condensed matter physics , analytical chemistry (journal) , chemistry , physics , electrode , organic chemistry , diode , quantum mechanics , chromatography
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