Open AccessInvestigation of Intermittent Enhancement of Ion Emission from a Tungsten Surface Using the Field-Ion Microscope
Author(s) -
Victor G. Weizer
Publication year - 1971
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.1660040
Subject(s) - field ion microscope , tungsten , neon , ion , ionization , microscope , atomic physics , field electron emission , helium , field emission microscopy , atom (system on chip) , materials science , chemistry , common emitter , argon , optics , optoelectronics , physics , electron , quantum mechanics , computer science , metallurgy , embedded system , organic chemistry , diffraction
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