Open AccessERRATA: ELECTROMIGRATION-INDUCED FAILURES IN ALUMINUM FILM CONDUCTORS
Author(s) -
J.C. Blair,
P. B. Ghate,
C. T. Haywood
Publication year - 1970
Publication title -
applied physics letters
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.1653304
Subject(s) - electromigration , aluminium , electrical conductor , materials science , optoelectronics , condensed matter physics , engineering physics , metallurgy , composite material , physics
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom