Atomic-scale depth selectivity of soft x-ray resonant Kerr effect | Zendy

KiSuk Lee | Zendy; SangKoog Kim | Zendy; Jeffrey B. Kortright | Zendy

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Atomic-scale depth selectivity of soft x-ray resonant Kerr effect

Author(s) -

KiSuk Lee,

SangKoog Kim,

Jeffrey B. Kortright

Publication year - 2003

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.1622123

Subject(s) - kerr effect , penetration depth , materials science , magnetization , condensed matter physics , magnetic field , atomic units , refractive index , optics , molecular physics , chemistry , physics , optoelectronics , quantum mechanics , nonlinear system

A study was performed to demonstrate that soft x-ray Kerr rotation, θK, versus incident grazing angle, φ, and energy, hv, measurements provide an extremely large depth selectivity on the atomic scales even in an ultrathin single layer, simply by choosing appropriate φ and hv around the resonant regions. Both the experimental and simulation results of φ vs θK measurements were considered for depth-varying magnetization reversals in a 3.5-nm-thick Co layer of NiFe/FeMn/Co/Pd films.open161

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