Extending the surface force apparatus capabilities by using white light interferometry in reflection | Zendy

Jason N. Connor | Zendy; Roger G. Horn | Zendy

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Extending the surface force apparatus capabilities by using white light interferometry in reflection

Author(s) -

Jason N. Connor,

Roger G. Horn

Publication year - 2003

Publication title -

review of scientific instruments

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.605

H-Index - 165

eISSN - 1089-7623

pISSN - 0034-6748

DOI - 10.1063/1.1619551

Subject(s) - optics , interference (communication) , interferometry , materials science , reflection (computer programming) , white light interferometry , optical coating , surface forces apparatus , visibility , coating , white light , light reflection , reflective surfaces , surface (topology) , nanometre , optoelectronics , mica , computer science , nanotechnology , physics , composite material , channel (broadcasting) , computer network , geometry , mathematics , programming language

The application of surface force apparatus (SFA) capabilities in measuring interactions between surfaces over nanometer separations was described. The technique is used when both the materials are transparent. It was observed that the poorly reflecting surface produce fringes that have low contrast and low finesse. The results show that the technique is successful when the visibility of the interference fringes is maximized.

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