Observation of growth and structure of Kr films physisorbed on Ag(111) and Ag(100) | Zendy

Aki Tosaka | Zendy; Taro Mitake | Zendy; Takashi Miura | Zendy; Ichiro Arakawa | Zendy

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Observation of growth and structure of Kr films physisorbed on Ag(111) and Ag(100)

Author(s) -

Aki Tosaka,

Taro Mitake,

Takashi Miura,

Ichiro Arakawa

Publication year - 2003

Publication title -

low temperature physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.356

H-Index - 43

eISSN - 1090-6517

pISSN - 1063-777X

DOI - 10.1063/1.1614190

Subject(s) - overlayer , ellipsometry , monolayer , materials science , substrate (aquarium) , diffraction , electron diffraction , layer (electronics) , crystallography , electron backscatter diffraction , crystal growth , low energy electron diffraction , condensed matter physics , analytical chemistry (journal) , optics , thin film , nanotechnology , chemistry , physics , oceanography , geology , chromatography

The structure and growth of two-dimensional crystals of Kr on Ag(111) and Ag(100) have been investigated by means of ellipsometry and eXtremely-low-current Low Energy Electron Diffraction (XLEED) under the quasi-equilibrium condition. The layered growth of a Kr film was observed up to the third layer by ellipsometry and the crystal geometry by XLEED. The Kr overlayer on Ag(100) has two types of alignment. In the predominant alignment, one of the unit vectors aligns with the 〈001〉 direction of the Ag substrate, while in the other it aligns with 〈011〉. The Kr–Kr spacing in a monolayer on Ag is 10% larger than that of the bulk.

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