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Anomalous phase transition in strained SrTiO3 thin films
Author(s) -
Feizhou He,
B. O. Wells,
S. M. Shapiro,
M. v. Zimmermann,
A. Clark,
X. X. Xi
Publication year - 2003
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.1589186
Subject(s) - tetragonal crystal system , condensed matter physics , materials science , superlattice , phase transition , epitaxy , lattice constant , synchrotron , diffraction , crystallography , x ray crystallography , ferroics , lattice (music) , crystal structure , quantum phase transition , chemistry , optics , quantum critical point , nanotechnology , physics , layer (electronics) , acoustics
We have studied the cubic to tetragonal phase transition in epitaxialSrTiO$_3$ films under various biaxial strain conditions using synchrotron X-raydiffraction. Measuring the superlattice peak associated with TiO$_6$ octahedrarotation in the low temperature tetragonal phase indicates the presence of aphase transition whose critical temperature is a strong function of strain,with T$_C$ as much as 50K above the corresponding bulk temperature.Surprisingly, the lattice constants evolve smoothly through the transition withno indication of a phase change. This signals an important change in the natureof the phase transition due to the epitaxy strain and substrate clampingeffect. The internal degrees of freedom (TiO$_6$ rotations) have becomeuncoupled from the overall lattice shape.Comment: 4 pages, 3 figures, REVTeX

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