Determination of texture by infrared spectroscopy in titanium oxide–anatase thin films
Author(s) -
Carlos Pecharromán,
F. Gracia,
Juan P. Holgado,
Manuel Ocaña,
Agustín R. GonzálezElipe,
J. Bassas,
José Santiso,
António Figueras
Publication year - 2003
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.1560858
Subject(s) - anatase , materials science , thin film , infrared spectroscopy , absorbance , texture (cosmology) , spectroscopy , anisotropy , infrared , analytical chemistry (journal) , titanium oxide , diffraction , titanium , dielectric , optics , optoelectronics , chemistry , nanotechnology , physics , metallurgy , organic chemistry , photocatalysis , quantum mechanics , artificial intelligence , computer science , image (mathematics) , catalysis
12 pages, 6 figures, 4 tables, 2 appendix.-- PACS: 68.55.Jk; 78.66.Nk; 78.30.HvA theoretical model to determine the effective dielectric tensor of heterogeneous materials composed by anisotropic microcrystallites has been introduced to explain the infrared spectral features of textured thin films of uniaxial materials as the function of a textural parameter. This theoretical treatment is able to satisfactorily reproduce the experimental absorbance spectra of TiO2–anatase thin films chosen as a model system. Comparison of texture data obtained from infrared spectroscopy and x-ray diffraction are in good agreement which support the validity of the proposed model.Peer reviewe
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom