Microwave absorption on a thin film | Zendy

H. Bosman | Zendy; Y. Y. Lau | Zendy; R. M. Gilgenbach | Zendy

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Microwave absorption on a thin film

Author(s) -

H. Bosman,

Y. Y. Lau,

R. M. Gilgenbach

Publication year - 2003

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.1556969

Subject(s) - resistive touchscreen , thin film , microwave , materials science , absorption (acoustics) , window (computing) , optics , optoelectronics , composite material , nanotechnology , electrical engineering , physics , telecommunications , computer science , engineering , operating system

With the use of a simple model, it is shown that a thin film of contaminant on a microwave window may absorb up to 50% of the incident power, even if the film thickness is only a small fraction of its resistive skin depth. This unexpectedly large amount of absorption is conjectured to have played a significant role in window failure. The temperature rise in a thin film is estimated. © 2003 American Institute of Physics

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