Optical properties of SiGe alloys | Zendy

Rajeev Ahuja | Zendy; Clas Persson | Zendy; A. Ferreira da Silva | Zendy; J. S. de Almeida | Zendy; C. Moysés Araújo | Zendy; Börje Johansson | Zendy

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Optical properties of SiGe alloys

Author(s) -

Rajeev Ahuja,

Clas Persson,

A. Ferreira da Silva,

J. S. de Almeida,

C. Moysés Araújo,

Börje Johansson

Publication year - 2003

Publication title -

journal of applied physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.699

H-Index - 319

eISSN - 1089-7550

pISSN - 0021-8979

DOI - 10.1063/1.1555702

Subject(s) - dielectric function , dielectric , ellipsometry , condensed matter physics , tin , materials science , germanium compounds , function (biology) , permittivity , germanium , silicon , thin film , physics , optoelectronics , nanotechnology , metallurgy , evolutionary biology , biology

The optical properties of Si1-xGex have been investigated theoretically using a full-potential linear muffin-tin-orbital method. We present the density-of-states as well as the real and imaginary parts of the dielectric function. The calculated dielectric function was found to be in good agreement with the spectroscopic ellipsometry measurements by J. Bahng , J. Phys.: Condens. Matter 13, 777 (2001), and we obtained a static dielectric constant of epsilon(0)=12.19+2.45x in the Si rich regime (xless than or equal to0.5).

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