Reliability Methods for Shield Design Process
Author(s) -
R. K. Tripathi
Publication year - 2003
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.1541383
Subject(s) - electromagnetic shielding , shield , spacecraft , computer science , reliability (semiconductor) , limiting , engineering design process , radiation protection , radiation shielding , reliability engineering , space exploration , process (computing) , space environment , cosmic ray , component (thermodynamics) , nuclear engineering , aerospace engineering , systems engineering , mechanical engineering , physics , electrical engineering , engineering , nuclear physics , petrology , power (physics) , quantum mechanics , geophysics , thermodynamics , geology , operating system
Providing protection against the hazards of space radiation is a major challenge to the exploration and development of space. The great cost of added radiation shielding is a potential limiting factor in deep space operations. In this enabling technology, we have developed methods for optimized shield design over multi-segmented missions involving multiple work and living areas in the transport and duty phase of space missions. The total shield mass over all pieces of equipment and habitats is optimized subject to career dose and dose rate constraints. An important component of this technology is the estimation of two most commonly identified uncertainties in radiation shield design, the shielding properties of materials used and the understanding of the biological response of the astronaut to the radiation leaking through the materials into the living space. The largest uncertainty, of course, is in the biological response to especially high charge and energy (HZE) ions of the galactic cosmic rays. These uncertainties are blended with the optimization design procedure to formulate reliability-based methods for shield design processes. The details of the methods will be discussed.
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