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Biaxial strain-modified valence and conduction band offsets of zinc-blende GaN, GaP, GaAs, InN, InP, and InAs, and optical bowing of strained epitaxial InGaN alloys
Author(s) -
Paul R. C. Kent,
Gus L. W. Hart,
Alex Zunger
Publication year - 2002
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.1524299
Subject(s) - bowing , pseudopotential , materials science , condensed matter physics , epitaxy , band gap , conduction band , wide bandgap semiconductor , wurtzite crystal structure , valence (chemistry) , gallium arsenide , optoelectronics , zinc , chemistry , nanotechnology , metallurgy , physics , philosophy , theology , layer (electronics) , quantum mechanics , electron , organic chemistry
Using density-functional calculations, we obtain the (001) biaxial strain dependence of the valence and conduction band energies of GaN, GaP, GaAs, InN, InP, and InAs. The results are fit to a convenient-to-use polynomial and the fits provided in tabular form. Using the calculated biaxial deformation potentials in large supercell empirical pseudopotential calculations, we demonstrate that epitaxial strain reduces the InGaN alloy bowing coefficient compared to relaxed bulk alloys.

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