Stress-induced electron emission from nanocomposite amorphous carbon thin films

Traditionally, the emission of electrons from materials have been explained using either the Fowler-Nordheim emission mechanism where high electric fields are used to extract electrons from surfaces or using conventional thermal emission where high currents are used to 'boil' off electrons to vacuum. In this letter, we propose an alternative mechanism for electron emission from highly compressive thin films based on stress-induced 'band structure' modification of nano-ordered sp(2) regions in the thin films. Experimental results are recorded which show that the localized compressive stress governs electron emission in the amorphous carbon thin films studied here rather than the surface nanostructures/features or the diamond-like sp(3) hybridized bond component. This analysis is in agreement with the concept of an internal or nongeometric field enhancement from sp(2) nanostructures giving rise to high dielectric inhomogeneity within the carbon thin film. The results presented could be extended to explain the anomalous field emission behavior of carbon nanotubes. (C) 2002 American Institute of Physics