Optical properties of PbTiO3, PbZrxTi1−xO3, and PbZrO3 films deposited by metalorganic chemical vapor on SrTiO3
Author(s) -
M. Moret,
M.A.C. Devillers,
Kerstin Wörhoff,
P.K. Larsen
Publication year - 2002
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.1486048
Subject(s) - refractive index , band gap , materials science , analytical chemistry (journal) , thin film , dispersion (optics) , chemical vapor deposition , epitaxy , ultraviolet , ellipsometry , optics , chemistry , optoelectronics , nanotechnology , physics , chromatography , layer (electronics)
Epitaxial PZT films have been prepared by metalorganic chemical vapor deposition on SrTiO3 substrates. Two sets of films of thicknesses 50–100 and 700–1400 nm, containing 0%, 40%, 60%, and 100% Zr, were prepared and investigated. The refractive index n was determined by ellipsometry for the thin films and by reflectivity for the thicker films. Results were obtained over the energy range from 1.55 to 3.72 eV, and with a Cauchy-fit extrapolation down to 0.62 eV. The refractive-index curves show a systematic variation with composition. For all compositions, n is close to 3.2 at 3.72 eV (333 nm), while at 1.55 eV (800 nm) n is 2.35 for PZ and 2.61 for PT. In agreement with previous results we find that the optical band gap is essentially independent of composition for PZT. We obtained 3.660.1 eV. The n(E) results were analyzed by a Wemple–DiDomenico dispersion analysis, yielding results for the dispersion region in the ultraviolet. Unlike the band gap, which is insensitive to composition in PZT, the dispersion energy Ed decreases from PT to PZ in the same fashion as the refractive index in the transparent region
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom